Space survivability for printed electronics applications

Author:

Ouchen FahimaORCID,Aga RobertoORCID,Harvey Malia,Heckman Emily

Abstract

Abstract The effects of atomic oxygen (AO) in low earth orbit and the physical effects of space launch on printed materials were studied for aerosol-jet printed Au and Ag through a 6 month exposure period on the Materials International Space Station Experiment (MISSE). RF and DC test platforms were designed for two printed electronics-compatible substrates (Rogers CLTE-XT and Ferro L8) to assess the amount of degradation caused by AO exposure in space. A passivation layer of CORIN-XLS applied over the printed metal traces was also studied for its effectiveness. Both bare and passivated test structures of printed Ag and Au traces were exposed to low earth orbit on the 10th MISSE mission. The effects of AO and the 6 month space exposure on the samples are reported here.

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

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