A ten-channel eikonal treatment of differential and integral cross sections and of the (λ,χ) parameters for the n=2 and 3 excitations of helium by electron impact
Author:
Publisher
IOP Publishing
Subject
Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/0022-3700/8/i=10/a=020/pdf
Reference37 articles.
1. A theoretical study of fast electron-helium scattering
2. Accurate first Born approximation cross sections for the excitation of helium by fast electrons
3. The use of second order potentials in the theory of the scattering of charged particles by atoms. IV. Electron scattering of helium atoms
4. The use of second-order potentials in the theory of scattering of charged particles by atoms. VIII. The excitation of the n=3 levels of helium by electron and proton impact
5. The use of second-order potentials in the theory of scattering of charged particles by atoms. IX. The excitation of hydrogen and helium to the n=2, S levels by electron impact
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