Rate coefficients for the attachment reactions of electrons with c-C7F14, CH3Br, CF3Br, CH2Br2and CH3I determined between 200 and 600K using the FALP technique-Reference-Cited by-同舟云学术

Rate coefficients for the attachment reactions of electrons with c-C7F14, CH3Br, CF3Br, CH2Br2and CH3I determined between 200 and 600K using the FALP technique

Published:1984-09-28 Issue:18 Volume:17 Page:3827-3833
ISSN:0022-3700
Container-title:Journal of Physics B: Atomic and Molecular Physics
language:
Short-container-title:J. Phys. B: At. Mol. Phys.

Author:

Alge E,Adams N G,Smith D

Publisher

IOP Publishing

Subject

Atomic and Molecular Physics, and Optics

Link

http://stacks.iop.org/0022-3700/17/i=18/a=019/pdf

Reference22 articles.

1. Measurements of the dissociative recombination coefficients of O2+, NO+and NH4+in the temperature range 200-600K

2. Electron capture and ionization phenomena in SF6and C7F14

3. Electron disappearance in pulse irradiated CH3Cl, C2H5Cl, CH3Br, and C2H5Br

4. Electron Attachment to Halogenated Aliphatic Hydrocarbons

5. Experimental Determination of Rate Constants for Thermal Electron Attachment to Gaseous SF6 and C7F14

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