Total cross section measurement for e-SF6scattering down to 0.036 eV
Author:
Publisher
IOP Publishing
Subject
Atomic and Molecular Physics, and Optics
Link
http://stacks.iop.org/0022-3700/15/i=5/a=008/pdf
Reference21 articles.
1. Electron attachment to perfluorocarbon compounds. I.c‐C4F6, 2‐C4F6, 1,3‐C4F6,c‐C4F8and 2‐C4F8
2. Cross Sections for Electron Attachment Resonances Peaking at Subthermal Energies
3. Erratum: Cross Sections for Electron Attachment Resonances Peaking at Subthermal Energies
4. Experimental SF6−/SF6andCl−/CFCl3Electron-Attachment Cross Sections in the Energy Range 0-200 meV
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