Analysis of modulated Ho2PdSi3crystal structure at PdKand HoLabsorption edges using resonant elastic X-scattering-Reference-Cited by-同舟云学术

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Analysis of modulated Ho2PdSi3crystal structure at PdKand HoLabsorption edges using resonant elastic X-scattering

Published:2016-01-20 Issue:6 Volume:28 Page:066002
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Nentwich Melanie,Zschornak Matthias,Richter Carsten,Novikov Dmitri,Meyer Dirk C

Funder

European Social Fund

Bundesministerium für Bildung und Forschung

European regional development fund

European Commission

Deutsche Forschungsgemeinschaft

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://stacks.iop.org/0953-8984/28/i=6/a=066002/pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Treatment of multiple-beam X-ray diffraction in energy-dependent measurements;Journal of Synchrotron Radiation;2024-01-01

2. Structure variations within RSi2 and R 2Si3 silicides. Part II. Structure driving factors;Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials;2020-05-15

3. Structure variations within RSi2 and R 2 TSi3 silicides. Part I. Structure overview;Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials;2020-03-12

4. The Complex Electronic Phase Diagram of Single-Crystalline R2PdSi3 (R = Ho, Dy) Studied by Thermal Expansion and Magnetostriction;Journal of the Physical Society of Japan;2019-09-15

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