A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/24/i=21/a=215301/pdf
Reference14 articles.
1. Mechanical properties of nanocrystalline materials
2. Diffraction Analysis of the Microstructure of Materials
3. The non-additivity and curvature corrections in the variance method of X-ray line-broadening analysis
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