Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures-Reference-Cited by-同舟云学术

Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures

Published:2002-12-18 Issue:2 Volume:15 Page:55-66
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Liang J S,Wang S D,Huang Y S,Tien C W,Chang Y M,Chen C W,Li N Y,Tiong K K,Pollak F H

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://stacks.iop.org/0953-8984/15/i=2/a=306/pdf

Reference27 articles.

1. Digital transmission link using surface emitting lasers and photoreceivers

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4. In-plane photoluminescence of vertical cavity surface-emitting laser structures

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