Elementary structural building blocks encountered in silicon surface reconstructions-Reference-Cited by-同舟云学术

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Elementary structural building blocks encountered in silicon surface reconstructions

Published:2008-12-01 Issue:1 Volume:21 Page:013001
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Battaglia Corsin,Gaál-Nagy Katalin,Monney Claude,Didiot Clément,Schwier Eike Fabian,Garnier Michael Gunnar,Onida Giovanni,Aebi Philipp

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://stacks.iop.org/0953-8984/21/i=1/a=013001/pdf

Reference37 articles.

1. Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low‐Energy Electron Diffraction

2. Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy

3. Major stable surface of silicon: Si(20 4 23)

4. Direct observation of an increase in buckled dimers on Si(001) at low temperature

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1. Mn-based MXene with high lithium-ion storage capacity;Nano Research;2023-12-29

2. Electronic structure simulation of thin silicon layers: Impact of orientation, confinement, and strain;Physica E: Low-dimensional Systems and Nanostructures;2023-01

3. Perspectives on solution processing of two-dimensional MXenes;Materials Today;2021-09

4. Homopolar cubic semiconductors: clean silicon surfaces Si(100), Si(110), and Si(111);Physics of Solid Surfaces;2018

5. Clean surfaces of semiconductors: introductory remarks;Physics of Solid Surfaces;2018

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