First principles studies of an Si tip on an Si(100)2 × 1 reconstructed surface
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/21/i=18/a=185006/pdf
Reference51 articles.
1. Atomic Force Microscope
2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
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4. Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
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