Electron diffraction methods for the analysis of silicon carbide surfaces and the controlled growth of polytype heterostructures
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/16/i=17/a=008/pdf
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1. Heterocrystalline Structures: New Types of Superlattices?
2. Chemical trend of band offsets at wurtzite/zinc-blende heterocrystalline semiconductor interfaces
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