The growth-temperature-dependent interface structure of yttria-stabilized zirconia thin films grown on Si substrates
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/22/i=1/a=015002/pdf
Reference25 articles.
1. Heteroepitaxial Growth of Yttria-Stabilized Zirconia (YSZ) on Silicon
2. XPS study of the interface reactions between buffer layers for HTSC thin films and silicon
3. Photoemission study of Zr- and Hf-silicates for use as high-κ oxides: Role of second nearest neighbors and interface charge
4. Advances in heteroepitaxy of oxides on silicon
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