Defect levels in Cu(In,Ga)Se2studied using capacitance and photocurrent techniques
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/28/i=21/a=215801/pdf
Reference24 articles.
1. Reinterpretation of defect levels derived from capacitance spectroscopy of CIGSe solar cells
2. Interpretation of admittance, capacitance-voltage, and current-voltage signatures in Cu(In,Ga)Se2 thin film solar cells
3. Bulk and metastable defects in CuIn1−xGaxSe2 thin films using drive-level capacitance profiling
4. Hopping Conduction Observed in Thermal Admittance Spectroscopy
5. Effect of substrate temperature and depostion profile on evaporated Cu(InGa)Se 2 films and devices
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