Improved approach for determining thin layer thermal conductivity using the 3ωmethod. Application to porous Si thermal conductivity in the temperature range 77

Improved approach for determining thin layer thermal conductivity using the 3ωmethod. Application to porous Si thermal conductivity in the temperature range 77–300 K

Published:2017-04-18 Issue:19 Volume:50 Page:195302
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Valalaki K,Nassiopoulou A G

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/50/i=19/a=195302/pdf

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