Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: enlightenment from high-energy x-ray diffraction-Reference-Cited by-同舟云学术

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Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: enlightenment from high-energy x-ray diffraction

Published:2017-04-26 Issue:20 Volume:50 Page:205305
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Ochoa D A,Levit R,Fancher C M,Esteves G,Jones J L,García J E

Funder

National Science Foundation

Office of Science

Secretaría de Estado de Investigación, Desarrollo e Innovación

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/50/i=20/a=205305/pdf

Reference31 articles.

1. Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics

2. Evaluation of domain wall motion in lead zirconate titanate ceramics by nonlinear response measurements

3. DIELECTRIC RELAXATION IN RELAXOR FERROELECTRICS

4. Unexpected dielectric response in lead zirconate titanate ceramics: The role of ferroelectric domain wall pinning effects

5. Effect of Mn-acceptor dopant on dielectric and piezoelectric responses of lead lanthanum zirconate titanate piezoceramics

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4. Effect of space charge on dielectric and magneto-dielectric behaviors in Ba0.85Ca0.15Zr0.1Ti0.9O3/La0.67Sr0.33MnO3 heterostructure;Ceramics International;2018-08

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