Abstract
Abstract
This paper aims to study the effect of rise rate (dV/dt) on the cumulative breakdown characteristics of biaxially oriented polypropylene (BOPP) film under nanosecond pulse voltage. The lifetime (N
L) of BOPP film under nanosecond pulse voltage with different pulse voltage amplitude and dV/dt were carried out, respectively. It is found that the N
L decreases with the increase of the pulse voltage amplitude, and the N
L decreases with the increase of the dV/dt. Meanwhile, the quantitative mathematical relationship between N
L and dV/dt, and pulse voltage amplitude are established, respectively, and it is concluded that both the rise rate and pulse voltage amplitude on the lifetime of BOPP film by the inverse power model. The results of the study are expected to provide the experimental basis and mechanistic explanation for the evaluation of film capacitor lifetime under extreme conditions.
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