Extraction of source resistance in thin film transistors using a single gated-probe outside the channel
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
https://iopscience.iop.org/article/10.1088/1361-6463/ab8670/pdf
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1. Plastic transistors in active-matrix displays
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