The interferometer patterns due to the primary aberrations-Reference-Cited by-同舟云学术

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The interferometer patterns due to the primary aberrations

Published:1925-12 Issue:2 Volume:27 Page:94-105
ISSN:1475-4878
Container-title:Transactions of the Optical Society
language:
Short-container-title:Trans. Opt. Soc.

Author:

Kingslake R

Publisher

IOP Publishing

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measuring the radius of curvature of spherical surfaces with actively tunable Fizeau and Twyman-Green interferometers;Applied Optics;2024-05-14

2. Spatially varying aberration calibration using a pair of matched periodic pinhole array masks;Optics Express;2019-01-09

3. Wavefront calculation from backscattering phase in a rough optical grid;Optical Manufacturing and Testing XII;2018-09-14

4. MEGARA Optics: Sub-aperture Stitching Interferometry for Large Surfaces;Publications of the Astronomical Society of the Pacific;2018-03-12

5. Optical Testing and Interferometry;Progress in Optics;2017

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