Temperature dependence of electrical characteristics of silicon MOS devices and circuits
-
Published:2017
Issue:
Volume:
Page:
-
ISSN:
-
Container-title:Extreme-Temperature and Harsh-Environment Electronics Physics, technology and applications
-
language:
-
Short-container-title:
Author:
Khanna Vinod Kumar
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Inter-tier Coupling Analysis in Back-illuminated Monolithic 3DSI Image Sensor Pixels;2021 10th International Conference on Modern Circuits and Systems Technologies (MOCAST);2021-07-05