Interferometric characterization and analysis of silver-exchanged glass waveguides buried by electromigration: slab, channel and slab-sided channel configurations-Reference-Cited by-同舟云学术

Interferometric characterization and analysis of silver-exchanged glass waveguides buried by electromigration: slab, channel and slab-sided channel configurations

Published:2006-01-06 Issue:2 Volume:8 Page:123-133
ISSN:1464-4258
Container-title:Journal of Optics A: Pure and Applied Optics
language:
Short-container-title:J. Opt. A: Pure Appl. Opt.

Author:

Blanco X Prieto

Publisher

IOP Publishing

Subject

Atomic and Molecular Physics, and Optics

Reference18 articles.

1. Ion-exchanged glass waveguides: a review

2. Simulation of field-assisted ion exchange for glass channel waveguide fabrication: effect of nonhomogeneous time-dependent electric conductivity

3. Concentration profile calculation for buried ion-exchanged channel waveguides in glass using explicit space-charge analysis

4. Buried ion-exchanged glass waveguides:burial-depth dependence on waveguide width

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