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Localized charge imaging with scanning Kelvin probe microscopy

Published:2016-12-06 Issue:2 Volume:28 Page:025703
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Orihuela M F,Somoza A M,Colchero J,Ortuño M,Palacios-Lidón E

Funder

Fundacion Seneca

Ministerio de Economia y Competitividad

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/28/i=2/a=025703/pdf

Reference28 articles.

1. Introduction

2. Kelvin probe force microscopy and its application

3. AFM tip characterization by Kelvin probe force microscopy

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