Methodology for extraction of space charge density profiles at nanoscale from Kelvin probe force microscopy measurements
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://iopscience.iop.org/article/10.1088/1361-6528/aa9839/pdf
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4. Nanoscale Probing of Surface Charges in Functional Copper‐Metal Organic Clusters by Kelvin Probe Force Microscopy for Field‐Effect Transistors;Advanced Materials Interfaces;2021-09-26
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