Monitoring the transformation of aliphatic and fullerene molecules by high-energy electrons using surface-enhanced Raman spectroscopy-Reference-Cited by-同舟云学术

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Monitoring the transformation of aliphatic and fullerene molecules by high-energy electrons using surface-enhanced Raman spectroscopy

Published:2017-03-20 Issue:16 Volume:28 Page:165701
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Mojarad Nassir,Tisserant Jean-Nicolas,Beyer Hannes,Dong Hao,Reissner Patrick A,Fedoryshyn Yuriy,Stemmer Andreas

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/28/i=16/a=165701/pdf

Reference41 articles.

1. The Scaling Limit of MOSFETs due to Direct Source-Drain Tunneling

2. Lithography at EUV wavelengths

3. Carbon nanotube computer

4. The Scaling Limit of MOSFETs due to Direct Source-Drain Tunneling

5. Carbon nanomaterials for electronics, optoelectronics, photovoltaics, and sensing

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Metal-Free All-Carbon Nanohybrid for Ultrasensitive Photoelectrochemical Immunosensing of alpha-Fetoprotein;ACS Sensors;2018-07-04

2. Surface-Enhanced Raman Spectroscopy of Carbon Nanomembranes from Aromatic Self-Assembled Monolayers;Langmuir;2018-02-12

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