Abstract
Abstract
Transmission x-ray microscopy (TXM), which can provide morphological and chemical structural information inside of battery component materials at tens of nanometer scale, has become a powerful tool in battery research. This article presents a short review of the TXM, including its instrumentation, battery research applications, and the practical sample preparation and data analysis in the TXM applications. A brief discussion on the challenges and opportunities in the TXM applications is presented at the end.
Funder
National Science Foundation
DOE Office of Science
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Cited by
34 articles.
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