Spectrally resolved x-ray beam induced current in a single InGaP nanowire-Reference-Cited by-同舟云学术

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Spectrally resolved x-ray beam induced current in a single InGaP nanowire

Published:2018-09-10 Issue:45 Volume:29 Page:454001
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Chayanun Lert^ORCID,Dagytė Vilgailė^ORCID,Troian Andrea^ORCID,Salomon Damien^ORCID,Borgström Magnus^ORCID,Wallentin Jesper^ORCID

Funder

Energimyndigheten

Röntgen-Ångström Cluster

Marie Sklodowska Curie Actions

Vetenskapsrådet

PhD4Energy

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://iopscience.iop.org/article/10.1088/1361-6528/aadc76/pdf

Reference27 articles.

1. X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures

2. Introduction to XAFS

3. EXAFS and XANES study of GaAs on Ga and As K edges

4. Direct imaging of anisotropic minority-carrier diffusion in ordered GaInP

5. Electronic properties of GaAs, InAs and InP nanowires studied by terahertz spectroscopy

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1. Operando photoelectron spectromicroscopy of nanodevices: Correlating the surface chemistry and transport in SnO2 nanowire chemiresistors;Journal of Electron Spectroscopy and Related Phenomena;2023-07

2. Energy material analysis via in-situ/operando scanning transmission x-ray microscopy: A review;Journal of Electron Spectroscopy and Related Phenomena;2023-07

3. X-ray in-line holography and holotomography at the NanoMAX beamline;Journal of Synchrotron Radiation;2022-01-01

4. Nanoscale X-ray detectors based on individual CdS, SnO2 and ZnO nanowires;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2021-10

5. Differential electron yield imaging with STXM;Ultramicroscopy;2021-03

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