SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2multilayers-Reference-Cited by-同舟云学术

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SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2multilayers

Published:2017-07-24 Issue:34 Volume:28 Page:345701
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Vieira E M F,Toudert J,Rolo A G,Parisini A,Leitão J P,Correia M R,Franco N,Alves E,Chahboun A,Martín-Sánchez J,Serna R,Gomes M J M

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://iopscience.iop.org/article/10.1088/1361-6528/aa7a50/pdf

Reference42 articles.

1. Silicon nanostructures for photonics and photovoltaics

2. Laser Level Scheme of Self-Interstitials in Epitaxial Ge Dots Encapsulated in Si

3. Lasing from Glassy Ge Quantum Dots in Crystalline Si

4. Silicon nanostructures for photonics

5. The structural and luminescence properties of porous silicon

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1. Thermal stability and properties of silicon-germanium nanocrystals;Physics Letters A;2024-11

2. Optimizing photocurrent intensity in layered SiGe heterostructures;Semiconductor Science and Technology;2024-09-09

3. Optimizing SiGe–SiO₂ Visible–Short‐Wave Infrared Photoresponse by Modulating Interplay Between Strain and Defects Through Annealing;Advanced Photonics Research;2024-06-19

4. Influence of SiGe Nanocrystallization on Short-Wave Infrared Sensitivity of SiGe–TiO2 Films and Multilayers;The Journal of Physical Chemistry C;2020-10-29

5. Fabrication and characterization of Si1−xGex nanocrystals in as-grown and annealed structures: a comparative study;Beilstein Journal of Nanotechnology;2019-09-17

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