Correlation between composition, microstructure, and emission properties in Nd-doped Si-rich Si oxynitride films: investigation into the nature of the sensitizer-Reference-Cited by-同舟云学术

Correlation between composition, microstructure, and emission properties in Nd-doped Si-rich Si oxynitride films: investigation into the nature of the sensitizer

Published:2018-11-21 Issue:4 Volume:30 Page:045702
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Liang C-H,An Y-T^ORCID,Jin W,Meng D-C,Wang D-P,Chen C-A,Liu K-Z,Kleyn A W,Labbé C,Cardin J,Gourbilleau F

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://iopscience.iop.org/article/10.1088/1361-6528/aaea23/pdf

Reference48 articles.

1. Optical properties of PECVD erbium-doped silicon-rich silica: evidence for energy transfer between silicon microclusters and erbium ions

2. Er3+ ions–Si nanocrystals interactions and their effects on the luminescence properties

3. Structural and emission properties of Tb3+-doped nitrogen-rich silicon oxynitride films

4. Strong exciton-erbium coupling in Si nanocrystal-doped SiO2

5. Effect of hydrogen passivation on the photoluminescence of Tb ions in silicon rich silicon oxide films

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