Abstract
Abstract
In this paper, the independent component analysis (ICA) algorithm, combined with wavelet algorithm, are introduced to diagnose the radiation noise source, also to segregate various radiation noise components. The nonlinear time domain signals of supeposed rradiation noises are measured using multi-channel high-speed digital oscilloscope. Double frequency domain analysis of radiation noise are conducted with the proposed method. Furtherly, time-frequency joint graph of excessive radiation noise are accessed, according to overclock points. The radiation noise component is determined by employing signal separation algorithm. The effective diagnosis of common frequency radiation noise is thus realized, which contributes to reducing the radiated noise electronic device emitted.
Reference16 articles.
1. 1/f noise and radiation effects in MOS devices;Fleetwood;IEEE Transactions on Electron Devices,1994
2. Effects of Radiation on the Noise Performance of Transistors;Lauritzen;IEEE Transactions on Nuclear Science,1972