Dependence of pyroelectric response on inter-electrode capacitance for integrated-optical circuits utilizing x-cut LiNbO3 chips

Abstract

Abstract Experimental study of the pyroelectric effect has been made for multi-function integrated-optical circuits (MIOC) utilizing x-cut LiNbO3 chips. It has been experimentally established that pyroelectric voltage is proportional to the temperature scanning rate, and a voltage magnitude depends significantly on capacitances of chip parts between the MIOC electrodes. The pyroelectric effect is considered by us to be an important source of the thermal instability of MIOC. The model of the pyroelectric contribution to the MIOC thermal instability is used to suggest the new methods reducing this instability.