Electrical component base testing in process of spacecraft configuration

Abstract

Abstract In current conditions and according to the quality level of Electronic Component Base of domestic production and due to the purchase of significant amount of electronic component base of foreign production - additional screening testing, diagnostic non-destructive testing with selective destructive analysis in professional testing centers are necessary. Costs of their performance are insignificant compared to possible losses of material (and not just material) while using spacecraft with bad quality of electrical component base. The authors show the need for additional testing of electronic component base applied in on-board equipment of spacecraft.