Author:
Cherkasov D A,Panov D V,Doludenko I M,Kanevskiy V M,Muslimov A E,Zagorskiy D L,Biziaev D A,A Bukharaev A
Abstract
Abstract
This article discusses the use of scanning microscopy in the study of one-dimensional nanostructures – nanowires. The nanowires were produced by matrix synthesis. Atomic force microscopy (AFM) of conical nanowires was carried out, and layered nanowires were investigated by AFM and magnetic force microscopy (MFM) methods.
Cited by
4 articles.
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