Reliability study of U-type multistage interconnection networks

Abstract

Abstract Multistage Interconnection Networks (MINs) are used in wide applications of multiprocessor systems in order to set up connections between various nodes such as processors and memory modules. Reliability can be considered as one of the most challenging issues in these systems because this can degrade or cancel the network performance and consequently the effort of the whole system. Here, a type of multistage fabric called U-type is selected for study, particularly in terms of its reliability. This fabric turns out to be the most appropriate type for constructing parallel systems due to the particular features that it possesses. This study reveals that U-type fabrics are ideal devices as they present mostly high values of reliability and low values of latency compared to unidirectional fabrics. This behaviour becomes more intensive when it is used in a cluster that demands service that includes a high percentage of “local type traffic.” Thus, U-type multistage devices can considerably enhance the connection points in constructing parallel systems, improving internal data flows.