Abstract
Abstract
In order to solve the problem of limited sample size and life data in the storage reliability evaluation of high-value weapons, the storage reliability evaluation method of electronic product based on storage performance modeling and simulation was studied. The problem of epistemic-aleatory mixed uncertainty propagation in product storage performance model with time degradation factor was discussed emphatically. The calculation method of two-level Monte Carlo simulation and non-intrusive polynomial chaos is proposed, which solved the problem that the computational capacity of storage performance simulation would increase explosivelly when the number of uncertainty parameters is large. Finally, the effectiveness of the method is verified by an example of circuit storage reliability evaluation, and the calculation efficiency is about 100 times higher than that of the two-lever MCS method.