A convenient method for X-ray analysis in TEM that measures mass thickness and composition
Author:
Publisher
IOP Publishing
Subject
General Medicine
Link
http://stacks.iop.org/1757-899X/304/i=1/a=012017/pdf
Reference8 articles.
1. Prospects for Single Standard Quantitative Analysis with SDD
2. Quantitative EPMA and TEM of unsupported films
3. The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new zeta-factor methods
4. Improved Efficiency Characterisation for Large Solid Angle SDD Detectors
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk Standards;Microscopy and Microanalysis;2023-11-09
2. Compositional Analysis of Chondritic Sulfide Material: A Test of the Mass-Thickness Approach to Quantitative EDS in the TEM;Microscopy and Microanalysis;2021-07-30
3. Measuring the Thickness of 2D Materials Using EDS;Microscopy and Microanalysis;2020-07-30
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