Track parameters investigate of oblique incident of alpha particles irradiated CR-39 detector

Abstract

Abstract In this work, the track etch-rate VT and etch-rate ratio V of CR-39 detector irradiated by alpha particles was investigated at different incident angles. The change of the track etch-rate and etch-rate ratio along the particle trajectories showed that these functions are not affected by the inclination of the particle trajectory with respect to the normal on the detector surface.