Feasibility of X-ray analysis of multi-layer thin films at a single beam voltage-Reference-Cited by-同舟云学术

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Feasibility of X-ray analysis of multi-layer thin films at a single beam voltage

Published:2010-02-01 Issue: Volume:7 Page:012027
ISSN:1757-899X
Container-title:IOP Conference Series: Materials Science and Engineering
language:
Short-container-title:IOP Conf. Ser.: Mater. Sci. Eng.

Author:

Statham P J

Publisher

IOP Publishing

Subject

General Medicine

Link

http://stacks.iop.org/1757-899X/7/i=1/a=012027/pdf

Reference6 articles.

1. X-Ray microanalysis of stratified specimens

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1. Inverse Modeling of Heterogeneous Structures in Electron Probe Microanalysis;Microscopy and Microanalysis;2024-07-31

2. Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Progress in Materials Science;2021-07

3. Electron probe microanalysis: A review of recent developments and applications in materials science and engineering;Progress in Materials Science;2021-02

4. Chemical Reactions Impede Thermal Transport Across Metal/β-Ga2O3 Interfaces;Nano Letters;2019-11-20

5. Reference-free evaluation of thin films mass thickness and composition through energy dispersive X-ray spectroscopy;Materials Characterization;2019-07

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