Coating thickness measurement by electron probe microanalysis-Reference-Cited by-同舟云学术

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Coating thickness measurement by electron probe microanalysis

Published:1963-11 Issue:11 Volume:14 Page:813-816
ISSN:0508-3443
Container-title:British Journal of Applied Physics
language:
Short-container-title:Br. J. Appl. Phys.

Author:

Cockett G H,Davis C D

Publisher

IOP Publishing

Subject

General Engineering

Link

https://iopscience.iop.org/article/10.1088/0508-3443/14/11/320/pdf

Reference9 articles.

1. Electron Probe Microanalysis

2. Sur les bases physiques de l'analyse ponctuelle par spectrographie X

3. Range-Energy Relations for Electrons and the Determination of Beta-Ray End-Point Energies by Absorption

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