The accuracy of four-probe resistivity measurements on silicon
Author:
Publisher
IOP Publishing
Subject
General Engineering
Link
https://iopscience.iop.org/article/10.1088/0508-3443/13/5/311/pdf
Reference9 articles.
1. Improved Automatic Four‐Point Resistivity Probe
2. A four-point probe apparatus for measuring resistivity
3. On the influence of shape and variations in conductivity of the sample on four-point measurements
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