The quality of X-ray microanalysis in the ultra-soft X-ray region-Reference-Cited by-同舟云学术

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The quality of X-ray microanalysis in the ultra-soft X-ray region

Published:1967-08 Issue:8 Volume:18 Page:1033-1043
ISSN:0508-3443
Container-title:British Journal of Applied Physics
language:
Short-container-title:Br. J. Appl. Phys.

Author:

Andersen C A

Publisher

IOP Publishing

Subject

General Engineering

Link

https://iopscience.iop.org/article/10.1088/0508-3443/18/8/301/pdf

Reference12 articles.

1. Silicon Oxynitride: A Meteoritic Mineral

2. Electron Probe Microanalysis

3. The absorption of X rays in the range 7-17 by Be, Mg, Al, Cu and Ag

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2. Solving the iron quantification problem in low-kV EPMA: An essential step toward improved analytical spatial resolution in electron probe microanalysis—Olivines;American Mineralogist;2019-08-01

3. Low-Voltage Electron-Probe Microanalysis of Fe–Si Compounds Using Soft X-Rays;Microscopy and Microanalysis;2013-08-28

4. The History of Electron Probe Microanalysis in Biology;Electron Probe Microanalysis;1989

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