Minimum differences in height detectable in electron stereomicroscopy-Reference-Cited by-同舟云学术

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Minimum differences in height detectable in electron stereomicroscopy

Published:1962-03 Issue:3 Volume:13 Page:126-128
ISSN:0508-3443
Container-title:British Journal of Applied Physics
language:
Short-container-title:Br. J. Appl. Phys.

Author:

Nankivell J F

Publisher

IOP Publishing

Subject

General Engineering

Link

https://iopscience.iop.org/article/10.1088/0508-3443/13/3/310/pdf

Reference5 articles.

1. Sources of error in electron stereomicroscopy

2. Electron Microscopic Determination of Surface Elevations and Orientations

3. Correction of errors in electron stereomicroscopy

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