Characterization of external potential for field emission resonances and its applications on nanometer-scale measurements-Reference-Cited by-同舟云学术

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Characterization of external potential for field emission resonances and its applications on nanometer-scale measurements

Published:2018-04-12 Issue:4 Volume:20 Page:043014
ISSN:1367-2630
Container-title:New Journal of Physics
language:
Short-container-title:New J. Phys.

Author:

Lu Shin-Ming,Chan Wen-Yuan,Su Wei-Bin,Pai Woei Wu,Liu Hsiang-Lin,Chang Chia-Seng

Funder

Ministry of Science and Technology

Academia Sinica

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://iopscience.iop.org/article/10.1088/1367-2630/aab5c7/pdf

Reference32 articles.

1. Zur berechnung des tunnelstroms durch eine trapezförmige potentialstufe

2. Tunneling Spectroscopy and Inverse Photoemission: Image and Field States

3. Electron Interferometry at Crystal Surfaces

4. Interplay between transmission background and Gundlach oscillation in scanning tunneling spectroscopy

5. Unusual mosaic image of theSi(111)−(7×7)surface coinciding with field emission resonance in scanning tunneling microscopy

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1. Growth and local electronic properties of Cobalt nanodots underneath graphene on SiC(0001);Carbon;2023-05

2. Characterization of apex structures of scanning tunneling microscope tips with field emission resonance energies;Japanese Journal of Applied Physics;2022-07-22

3. Probing tip-induced attractive deformation of graphite surfaces through wave function dissipation in field emission resonance;Journal of Physics Communications;2022-07-01

4. Impact of band structure on wave function dissipation in field emission resonance;Physical Review B;2022-05-06

5. Observing quantum trapping on MoS2 through the lifetimes of resonant electrons: revealing the Pauli exclusion principle;Nanoscale Advances;2020

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