Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials∗
Author:
Affiliation:
1. EcoTopia Science Institute, Nagoya University, Chikusa-ku, Nagoya, 464-8603, Japan
Publisher
Informa UK Limited
Subject
General Materials Science
Link
https://www.tandfonline.com/doi/pdf/10.1088/1468-6996/9/1/014111
Reference23 articles.
1. HillR J 1993 The Rietveld Method R AYoung Oxford Oxford University Press
2. SpenceJ C H 2003 High Resolution Electron Microscopy 3rd edn Oxford Oxford University Press
3. Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope
4. Towards sub-Å electron beams
5. The Theoretical Resolution Limit of the Electron Microscope
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