Active nanocharacterization of nanofunctional materials by scanning tunneling microscopy
Author:
Affiliation:
1. Advanced Nano Characterization Center, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047, Japan
Publisher
Informa UK Limited
Subject
General Materials Science
Link
https://www.tandfonline.com/doi/pdf/10.1088/1468-6996/9/1/013003
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1. Nanotechnology
2. Active Nano-Characterization and Technology
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4. Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space
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