Behavior of charges in the active zone of composite OFET under the source-drain electric field
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/661/i=1/a=012029/pdf
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1. Kelvin probe force microscopy of hole leakage from the active region of a working injection-type semiconductor laser diode
2. Memory effects in field-effect transistor structures based on composite films of polyepoxypropylcarbazole with gold nanoparticles
3. Charge carrier accumulation and relaxation effects in the active region of polymer and composite (polymer-gold nanoparticles) field-effect transistor structures
4. Memory effect in organic transistor: Controllable shifts in threshold voltage
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