Author:
Lv Benqing,Ning Yinhang,Huang Zhihao,Fu Longlong,Xu Shuai
Abstract
Abstract
The loss characteristics of 20WTG1500 silicon steel wafers are simulated and studied by using the Epstein square circle method. First, the loss-measured data are fitted based on the classical Bertotti loss model. When working, a Levenberg-Marquardt (L-M) algorithm is proposed to calculate the parameters of the loss model accurately. For the problem of significant calculation errors of hysteresis loss and stray loss in the classical loss separation model, a variable parameter closely related to the magnetic induction intensity is constructed by using the fixed parameter values of the classical loss model. Then, the loss improvement model is proposed. The accuracy of the improved model is proved by comparing the fitting results of the enhanced model with the measured data.
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