Analytical calculation of diffraction order intensities for a hyperspectrometer

Abstract

Abstract We employ a geometric optics approach to calculate the eikonal of a light field at the output of a diffraction grating in the immediate microrelief vicinity. Analytic relations to calculate the diffraction order intensities as functions of the grating step height, line spacing, wavelength of incident light, and incidence angle are deduced. By way of illustration, intensities of the diffraction orders for a blazed reflection grating with a 555-nm operating wavelength utilized in hyperspectrometers are calculated.