Analysis of Lattice Constants and Error for The Hexagonal Crystal Structure of Silicon Dioxide Using The Cramer-Cohen Method
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Published:2021-10-01
Issue:1
Volume:2019
Page:012071
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ISSN:1742-6588
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Container-title:Journal of Physics: Conference Series
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language:
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Short-container-title:J. Phys.: Conf. Ser.
Author:
Kurniawati N,Wardani D A P,Hariyanto B,Har N P,Darmawan N,Irzaman
Abstract
Abstract
Has successfully analyzed the lattice constants and the error of the hexagonal crystal structure of silicon dioxide (SiO2) using the Cramer-Cohen method. The peak data for the silicon dioxide material used are secondary data from the ICDD. The Cramer-Cohen method calculations show that the lattice constants are relatively the same as the secondary data from the ICDD, with an average error analysis value of 0,001531805%. This shows that the analysis of the lattice constant and the error of the hexagonal crystal structure of silicon dioxide (SiO2) using the Cramer-Cohen method is very accurate.
Subject
General Physics and Astronomy
Reference5 articles.
1. X-Ray Diffraction: A Powerful Method of Characterizing Nanomaterials;Sharma,2012
2. Karakterisasi XRD Dan SEM Pada Material Nanopartikel Serta Peran Material Nanopartikel Dalam Drug Delivery System;Mursal;Pharma Xplore: Jurnal Sains dan Ilmu Farmasi,2018
3. ICDD Database Search
4. Cramer Rule for The Unique Solution of Restricted Matrix Equations Over the Quaternion Skew Field;Song;Computers & Mathematics with Applications,2011