Methods and models of calibration of vector network analyzers

Abstract

Abstract Currently, measurement devices and instruments operating in the microwave range are widespread. Therefore, the problem arises of periodic checks, verifications and calibrations of such devices and instruments. The task of minimizing the systematic measurement error is a key task when performing verification of measuring instruments, measuring systems and devices operating in the microwave range using vector network analyzers. Various methods and models for performing calibrations of a vector network analyzer for determining the scattering parameters of passive microwave devices are described. The analysis of calibration methods is carried out, recommendations for its applications are given.