Author:
Kotlikov E N,Andreev V M,Lavrovskaya N P,Tereshchenko G V
Abstract
Abstract
The determination of optical coefficients of absorbing coatings in the far infrared spectrum on silicon substrates is considered in this paper. To find them, a technique is used based on taking into account correction associated with absorption spectra. Correction of the spectra is carried out by exploitation models of the absorbing film. Optical coefficients of BaYF5 films in the spectrum region of 1.3-27 microns were obtained. On their basis, a band-pass metal-dielectric filter was synthesized for a wavelength 5 micron.
Subject
General Physics and Astronomy