A comparison of TEM and DLS methods to characterize size distribution of ceramic nanoparticles
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/733/i=1/a=012039/pdf
Reference11 articles.
1. A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions
2. A comparative study of submicron particle sizing platforms: Accuracy, precision and resolution analysis of polydisperse particle size distributions
3. Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials
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