Characterization of multilayer nano-absorbers

Abstract

Abstract Full characterization of thin nano-carbon and nano-ferrite absorbers was performed in the frequency range 5-40 GHz by a combination of two microwave methods – a resonance one using a pair of cylindrical resonators with different excited modes, and a broadband one, where the samples cover a 50-ohm microstrip line. The results show a reliable extraction of the complex dielectric and magnetic parameters of 20-60-μm thick absorber layers by the resonance method considered (including the anisotropy of these parameters) and a successful verification of their values in the wide frequency range.